背面散乱を考慮した全オージェ電子強度の動径方向分布
Effect of the back-scattered electron
on the radial distribution of total Auger electron intensity (Reference)
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by K.Amaya 2010, Setsunan University
Reference
Minimum detectable dimension, resolving power and quantification
of scanning Auger microscopy at high lateral resolution†
Surf. Interface Anal. 14 (1989) 354-366.
J. Cazaux
Backcattering Correction for Auger Electron Spectroscopy
1.Development of an Improved Backscattering Correction
Equation for Wide Analytical Conditions
Journal of Surface Analysis Vol.14,No.1(2007)pp.9-19
Sigeo Tanuma