MRI Simulation of BN Delta Doped Si Multilayer (Reference)
by M.Inoue, Setsunan University, Feb. 6, 2002


Surface and Interface Analysis, vol.21, 673-678 (1994)

"Atomic Mixing, Surface Roughness and Information Depth in High-resolution
AES Depth Profiling of a GaAs/AlAs Superlattice Structure"

Siegfried Hofmann
Max-Plank-Institut fur Metallforshung, Institut fur Werkstoffwissenschaft,
Seestrasse 92, D-70174 Stuttgart, Germany